Scanning probe image wizard: A toolbox for automated scanning probe microscopy data analysis | Zendy

Julian Stirling | Zendy; Richard A. J. Woolley | Zendy; Philip Moriarty | Zendy

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Scanning probe image wizard: A toolbox for automated scanning probe microscopy data analysis

Author(s) -

Julian Stirling,

Richard A. J. Woolley,

Philip Moriarty

Publication year - 2013

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.4827076

Subject(s) - toolbox , wizard , computer science , scanning probe microscopy , image processing , artificial intelligence , visualization , computer vision , resolution (logic) , microscopy , image resolution , image (mathematics) , materials science , computer graphics (images) , optics , nanotechnology , physics , world wide web , programming language

We describe SPIW (scanning probe image wizard), a new image processing toolbox for SPM (scanning probe microscope) images. SPIW can be used to automate many aspects of SPM data analysis, even for images with surface contamination and step edges present. Specialised routines are available for images with atomic or molecular resolution to improve image visualisation and generate statistical data on surface structure

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