Compton scattering for spectroscopic detection of ultra-fast, high flux, broad energy range X-rays
Author(s) -
Silvia Cipiccia,
S. M. Wiggins,
D. Maneuski,
E. Brunetti,
G. Vieux,
Xueming Yang,
R. C. Issac,
G. H. Welsh,
M. P. Anania,
M. R. Islam,
Bernhard Ersfeld,
R. A. Montgomery,
G. D. Smith,
M. Hoek,
D. Hamilton,
Nuno R. C. Lemos,
D. R. Symes,
P. P. Rajeev,
Val O. Shea,
J. M. Dias,
D. A. Jaroszynski
Publication year - 2013
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.4825374
Subject(s) - compton scattering , betatron , physics , bremsstrahlung , optics , photon , radiation , flux (metallurgy) , scattering , range (aeronautics) , atomic physics , nuclear physics , materials science , beam (structure) , metallurgy , composite material
Compton side-scattering has been used to simultaneously downshift the energy of keV to MeV energy range photons while attenuating their flux to enable single-shot, spectrally resolved, measurements of high flux X-ray sources to be undertaken. To demonstrate the technique a 1 mm thick pixelated cadmium telluride detector has been used to measure spectra of Compton side-scattered radiation from a Cobalt-60 laboratory source and a high flux, high peak brilliance X-ray source of betatron radiation from a laser-plasma wakefield accelerator
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