Phase-stepping interferometry of GaAs nanowires: Determining nano-wire radius | Zendy

Douglas J. Little | Zendy; Rajika L. Kuruwita | Zendy; A. Joyce | Zendy; Qian Gao | Zendy; Timothy Burgess | Zendy; C. Jagadish | Zendy; D. M. Kane | Zendy

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Phase-stepping interferometry of GaAs nanowires: Determining nano-wire radius

Author(s) -

Douglas J. Little,

Rajika L. Kuruwita,

A. Joyce,

Qian Gao,

Timothy Burgess,

C. Jagadish,

D. M. Kane

Publication year - 2013

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.4825153

Subject(s) - interferometry , nanowire , radius , phase (matter) , materials science , optics , optoelectronics , physics , computer security , quantum mechanics , computer science

Phase stepping interferometry is used to measure the size of near-cylindrical nanowires. Nanowires with nominal radii of 25 nm and 50 nm were used to test this by comparing specific measured optical phase profile values with theoretical values calculated using a wave-optic model of the Phase stepping interferometry (PSI) system. Agreement within 10% was found, which enabled nanowire radii to be predicted within 4% of the nominal value. This demonstration highlights the potential capability for phase stepping interferometry to characterize single nanoparticles of known geometry in the optical far-field.4 page(s

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