Open AccessMeasurement and modeling of reverse biased electroluminescence in multi-crystalline silicon solar cells
Author(s) -
Matthias Schneemann,
Thomas Kirchartz,
Reinhard Carius,
Uwe Rau
Publication year - 2013
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4824099
Subject(s) - electroluminescence , crystalline silicon , silicon , spectral line , wafer , photon , photon energy , materials science , range (aeronautics) , emission spectrum , molecular physics , band gap , charge carrier , atomic physics , radiation , spontaneous emission , physics , optoelectronics , optics , nanotechnology , laser , layer (electronics) , astronomy , composite material
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