Evaluation of the reliability of commercial concentrator triple-junction solar cells by means of accelerated life tests (ALT)
Author(s) -
Pilar EspinetGonzález,
Carlos Algora,
Neftalí Núñez,
Vincenzo Orlando,
Manuel Vázquez,
Jesús Bautista,
Kenji Araki
Publication year - 2013
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4822236
Subject(s) - weibull distribution , warranty , arrhenius equation , reliability (semiconductor) , triple junction , materials science , concentrator , accelerated aging , solar energy , activation energy , electrical engineering , optoelectronics , composite material , engineering , physics , chemistry , thermodynamics , mathematics , statistics , political science , law , organic chemistry , power (physics)
A temperature accelerated life test on commercial concentrator lattice-matched GaInP/GaInAs/Ge triple-junction solar cells has been carried out. The solar cells have been tested at three different temperatures: 119, 126 and 164 °C and the nominal photo-current condition (820 X) has been emulated by injecting current in darkness. All the solar cells have presented catastrophic failures. The failure distributions at the three tested temperatures have been fitted to an Arrhenius-Weibull model. An Arrhenius activation energy of 1.58 eV was determined from the fit. The main reliability functions and parameters (reliability function, instantaneous failure rate, mean time to failure, warranty time) of these solar cells at the nominal working temperature (80 °C) have been obtained. The warranty time obtained for a failure population of 5 % has been 69 years. Thus, a long-term warranty could be offered for these particular solar cells working at 820 X, 8 hours per day at 80 °C
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