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Iron-boron pair dissociation in silicon under strong illumination
Author(s) -
Xiaodong Zhu,
Deren Yang,
Xuegong Yu,
Jian He,
Yichao Wu,
Jan Vanhellemont,
Duanlin Que
Publication year - 2013
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4819481
Subject(s) - dissociation (chemistry) , silicon , boron , electron , materials science , electron bombardment , activation energy , chemical physics , atomic physics , chemistry , molecular physics , optoelectronics , physics , organic chemistry , quantum mechanics
The dissociation of iron-boron pairs (FeB) in Czochralski silicon under strong illumination was investigated. It is found that the dissociation process shows a double exponential dependence on time. The first fast process is suggested to be caused by a positive Fe in FeB capturing two electrons and diffusion triggered by the electron-phonon interactions, while the second slow one would involve the capturing of one electron followed by temperature dependent dissociation with an activation energy of (0.21 ± 0.03) eV. The results are important for understanding and controlling the behavior of FeB in concentrator solar cells

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