Iron-boron pair dissociation in silicon under strong illumination
Author(s) -
Xiaodong Zhu,
Deren Yang,
Xuegong Yu,
Jian He,
Yichao Wu,
Jan Vanhellemont,
Duanlin Que
Publication year - 2013
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4819481
Subject(s) - dissociation (chemistry) , silicon , boron , electron , materials science , electron bombardment , activation energy , chemical physics , atomic physics , chemistry , molecular physics , optoelectronics , physics , organic chemistry , quantum mechanics
The dissociation of iron-boron pairs (FeB) in Czochralski silicon under strong illumination was investigated. It is found that the dissociation process shows a double exponential dependence on time. The first fast process is suggested to be caused by a positive Fe in FeB capturing two electrons and diffusion triggered by the electron-phonon interactions, while the second slow one would involve the capturing of one electron followed by temperature dependent dissociation with an activation energy of (0.21 ± 0.03) eV. The results are important for understanding and controlling the behavior of FeB in concentrator solar cells
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom