Electrostatic method to estimate the mechanical properties of suspended membranes applied to nickel-coated graphene oxide
Author(s) -
Nawres Sridi,
Bérengère Lebental,
Joël Azevedo,
JeanChristophe P. Gabriel,
Anne Ghis
Publication year - 2013
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4817301
Subject(s) - graphene , materials science , flexural rigidity , membrane , modulus , deflection (physics) , oxide , composite material , rigidity (electromagnetism) , young's modulus , electrostatics , bending , electrostatic force microscope , elastic modulus , nanotechnology , atomic force microscopy , optics , metallurgy , chemistry , biochemistry , physics
We propose a method to estimate the bending rigidity and Young's modulus of thin conducting suspended membranes based on measuring the deflection of the membranes submitted to an electrostatic force. Our electrostatic method appears easier to implement and more reliable than AFM-based localized force-displacement measurements to estimate the bending rigidity and Young's modulus of slightly inhomogeneous materials. We apply the method on suspended graphene oxide (GO) sheets coated with a 5 nm thick Ni layer, providing a demonstration of electrostatic actuation for GO sheets. For a 7.7 nm thick membrane, a Young modulus of 360 GPa is found
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