Single-shot measurement of a terahertz electric-field waveform using a reflective echelon mirror | Zendy

Yasuo Minami | Zendy; Yusuke Hayashi | Zendy; Jun Takeda | Zendy; Ikufumi Katayama | Zendy

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Single-shot measurement of a terahertz electric-field waveform using a reflective echelon mirror

Author(s) -

Yasuo Minami,

Yusuke Hayashi,

Jun Takeda,

Ikufumi Katayama

Publication year - 2013

Publication title -

applied physics letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.182

H-Index - 442

eISSN - 1077-3118

pISSN - 0003-6951

DOI - 10.1063/1.4817011

Subject(s) - terahertz radiation , waveform , electric field , optics , grating , polarization (electrochemistry) , physics , signal (programming language) , terahertz spectroscopy and technology , optoelectronics , materials science , voltage , computer science , chemistry , quantum mechanics , programming language

Single-shot measurements of terahertz (THz) electric-field waveforms are demonstrated using a reflective echelon mirror, which produces multiple probe pulses with different time-delays. The polarization rotation of the probe pulses, due to the electro-optic effect induced by the THz electric field generated from grating-coupled LiNbO3, was imaged onto a two-dimensional complementary metal-oxide-semiconductor camera. A waveform with a weak peak field strength of 0.6 kV/cm was obtained with a good signal-to-noise ratio, demonstrating precise single-shot detection of the THz electric field waveform.

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