In-situ X-ray diffraction combined with scanning AC nanocalorimetry applied to a Fe0.84Ni0.16 thin-film sample
Author(s) -
John M. Gregoire,
Kechao Xiao,
Patrick J. McCluskey,
Darren Dale,
Gayatri Cuddalorepatta,
Joost J. Vlassak
Publication year - 2013
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4806972
Subject(s) - materials science , thin film , diffraction , synchrotron radiation , hysteresis , characterization (materials science) , x ray crystallography , differential scanning calorimetry , calorimetry , analytical chemistry (journal) , optics , nanotechnology , chemistry , condensed matter physics , thermodynamics , physics , chromatography
We combine the characterization techniques of scanning AC nanocalorimetry and x-ray diffraction to study phase transformations in complex materials system. Micromachined nanocalorimeters have excellent performance for high-temperature and high-scanning-rate calorimetry measurements. Time-resolved X-ray diffraction measurements during in-situ operation of these devices using synchrotron radiation provide unprecedented characterization of thermal and structural material properties. We apply this technique to a Fe0.84Ni0.16 thin-film sample that exhibits a martensitic transformation with over 350 K hysteresis, using an average heating rate of 85 K/s and cooling rate of 275 K/s. The apparatus includes an array of nanocalorimeters in an architecture designed for combinatorial studies.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom