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Measurement of 50-fs (rms) electron pulses
Author(s) -
Hungchi Lihn,
Pamela Kung,
Helmut Wiedemann,
David Bocek
Publication year - 1995
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.48044
Subject(s) - autocorrelation , physics , picosecond , electron , wavelength , optics , michelson interferometer , interferometry , atomic physics , laser , nuclear physics , statistics , mathematics
Electron pulses generated at the Stanford SUNSHINE facility with (Z-4.6) x 10' electrons per microbunch have been measured as short as 50fs (rms). The bunch length is determined by optical autocorrela- tion via a far-infrared Michelson interferometer using coherent transition radiation emitted at wavelengths longer than and equal to the bunch length. This frequency-resolved autocorrelation method demonstrates a better sub-picosecond resolving power than any existing time-resolved method. The experimental setup and the results will be described.

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