Formation mechanism of femtosecond laser-induced high spatial frequency ripples on semiconductors at low fluence and high repetition rate
Author(s) -
Ronan Le Harzic,
Frank Stracke,
Heiko Zimmermann
Publication year - 2013
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4803895
Subject(s) - femtosecond , fluence , laser , materials science , germanium , wavelength , refractive index , optics , silicon , semiconductor , optoelectronics , second harmonic generation , excited state , semiconductor laser theory , atomic physics , physics
Periodic high spatial frequency ripples structures (HSFL) have been generated in silicon (Si) and in germanium (Ge) at very low fluence below or close to the melting fluence threshold, at different wavelengths and at high repetition rate femtosecond laser pulses (80 MHz, 700-950 nm, 170 fs). HSFL initiation, formation, and arrangement combine structural modification of the surface initiated by heat accumulation of successive pulses with second harmonic generation. HSFL are wavelength dependent and the refractive index plays a central role on their periodicities. HSFL spacing follows quite well a law of = / 2 n*, where n * is the modified femtosecond laser excited refractive index as a function of the wavelength for Si and Ge
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