Separate-type scanner and wideband high-voltage amplifier for atomic-resolution and high-speed atomic force microscopy | Zendy

Kazuki Miyata | Zendy; Satoshi Usho | Zendy; Satoshi Yamada | Zendy; Shoji Furuya | Zendy; Kiyonori Yoshida | Zendy; Hitoshi Asakawa | Zendy; Takeshi Fukuma | Zendy

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Separate-type scanner and wideband high-voltage amplifier for atomic-resolution and high-speed atomic force microscopy

Author(s) -

Kazuki Miyata,

Satoshi Usho,

Satoshi Yamada,

Shoji Furuya,

Kiyonori Yoshida,

Hitoshi Asakawa,

Takeshi Fukuma

Publication year - 2013

Publication title -

review of scientific instruments

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.605

H-Index - 165

eISSN - 1089-7623

pISSN - 0034-6748

DOI - 10.1063/1.4802262

Subject(s) - scanner , wideband , materials science , amplifier , noise (video) , non contact atomic force microscopy , optics , optoelectronics , kelvin probe force microscope , physics , atomic force microscopy , nanotechnology , computer science , cmos , artificial intelligence , image (mathematics)

博士論文要旨Abstract 要約Outline 以下に掲載Review of Scientific Instruments 84(4) pp.043705-1-043705-8 2013. AIP Publishing. 共著者K. Miyata, S. Usho, S. Yamada, S. Furuya, K. Yoshida, H. Asakawa, T. Fukum

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