Open AccessElevated temperature, nano-mechanical testing in situ in the scanning electron microscope
Author(s) -
Jeffrey M. Wheeler,
Johann Michler
Publication year - 2013
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.4795829
Subject(s) - materials science , nanoindentation , composite material , scanning electron microscope , focused ion beam , indentation , silicon , optics , optoelectronics , physics , quantum mechanics , ion
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