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Note: Near-field imaging of thermal radiation at low temperatures by passive millimeter-wave microscopy
Author(s) -
Tatsuo Nozokido,
Manabu Ishino,
Hiroyuki Kudo,
Jongsuck Bae
Publication year - 2013
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.4794911
Subject(s) - optics , materials science , microscope , extremely high frequency , radiation , image resolution , millimeter , near and far field , thermal radiation , diffraction , microscopy , spectrum analyzer , resolution (logic) , infrared , thermal , optoelectronics , physics , artificial intelligence , meteorology , computer science , thermodynamics
Imaging of thermal radiation with a spatial resolution below the diffraction limit is demonstrated with a passive millimeter-wave microscope. This technique utilizes a sensitive radiometric receiver in combination with a scanning near-field microscope. Experiments were performed at 50 GHz (λ = 6 mm) with sample temperatures ranging from room temperature down to 160 K, and the performance was shown to be superior to that achieved with passive imaging systems in the infrared region. The images are affected by non-uniformities in the transmission of thermal radiation from the sample to the receiver via the near-field probe and the reflection of thermal radiation back to the receiver from the probe. The effects of these non-uniformities were successfully removed using a sample image acquired by active measurements using a vector network analyzer

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