Open AccessPreparation and characterization of Fe-Si-B thin films
Author(s) -
M. Satalkar,
S. N. Kane,
Alexandre Pasko,
Arlete Apolinário,
C. T. Sousa,
J. Ventura,
J. J. Belo,
J. M. Teixeira,
João P. Araújo,
F. Mazaleyrat,
Éric Fleury
Publication year - 2013
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4791207
Subject(s) - nanocrystalline material , materials science , scanning electron microscope , amorphous solid , film plane , thin film , magnetization , diffraction , characterization (materials science) , phase (matter) , perpendicular , composite material , magnetic anisotropy , optics , crystallography , nanotechnology , magnetic field , chemistry , geometry , physics , organic chemistry , mathematics , quantum mechanics
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