Atomic rearrangements in amorphous Al2O3 under electron-beam irradiation
Author(s) -
Ryusuke Nakamura,
Manabu Ishimaru,
Hidehiro Yasuda,
Hideo Nakajima
Publication year - 2013
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4790705
Subject(s) - amorphous solid , crystallization , transmission electron microscopy , materials science , electron beam processing , irradiation , excited state , acceleration voltage , electron , cathode ray , excitation , crystallography , range (aeronautics) , atomic physics , electron diffraction , chemical physics , chemistry , nanotechnology , diffraction , optics , physics , composite material , organic chemistry , quantum mechanics , nuclear physics
The electron-irradiation-induced crystallization of amorphous Al2O3 (a-Al2O3) was investigated by in-situ transmission electron microscopy under the wide electron-energy region of 25–300 keV. The formation of γ-Al2O3 nanocrystallites was induced by irradiating the a-Al2O3 thin film along with the formation of nanovoids in the crystalline grains regardless of the acceleration voltage. The crystallization became more pronounced with decreasing the electron energy, indicating that electronic excitation processes play a dominant role in the formation of γ-Al2O3. Radial distribution analyses suggested that a-Al2O3 transforms to γ-phase via the “excited” (“stimulated”) amorphous state, in which the breaking and rearrangement of unstable short-range Al-O bonds, i.e., fivefold-coordinated Al-O (AlO5) basic units, occur.
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