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Direct and quantitative broadband absorptance spectroscopy on small objects using Fourier transform infrared spectrometer and bilayer cantilever probes
Author(s) -
WeiChun Hsu,
Jonathan Tong,
Bolin Liao,
Brian R. Burg,
Gang Chen
Publication year - 2013
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4790184
Subject(s) - absorptance , materials science , spectrometer , fourier transform spectroscopy , fourier transform infrared spectroscopy , optics , cantilever , analytical chemistry (journal) , infrared , optoelectronics , spectroscopy , chemistry , physics , chromatography , composite material , reflectivity , quantum mechanics
A measurement platform is introduced that combines a bilayer cantilever probe with a Fourier transform infrared spectrometer to measure absolute spectral absorptance between wavelengths of 3 μm and 18 μm directly and quantitatively. The enhanced sensitivity provided by the cantilever probe enables the quantitative characterization of micro- and nanometer-sized samples. Validation of the technique is carried out by measuring the absorptance spectrum of a doped silicon thin film with a backside aluminum layer and found to agree well with the theoretical predictions. The presented technique is especially attractive for samples such as individual nanowires or nanoparticles, isolated molecules, powders, and photonic structures.United States. Dept. of Energy (Office of Basic Energy Sciences, Grant No. DE-FG02- 02ER45977)United States. Dept. of Defense (MURI via UIUC FA9550-08-1-0407)National Research Fund Luxembourg (Grant No. 893874

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