Open AccessPublisher's Note: “Nanoscale study of the current transport through transrotational NiSi/n-Si contacts by conductive atomic force microscopy” [Appl. Phys. Lett. 101, 261906 (2012)]
Author(s) -
Alessandra Alberti,
Filippo Giannazzo
Publication year - 2013
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4789899
Subject(s) - conductive atomic force microscopy , nanoscopic scale , atomic force microscopy , electrical conductor , condensed matter physics , nanotechnology , materials science , current (fluid) , microscopy , optoelectronics , physics , composite material , optics , thermodynamics
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