Ultrasonic flaw sizing - An overview | Zendy

Lester W. Schmerr | Zendy; Brady J. Engle | Zendy; Alexander Sedov | Zendy; Xiongbing Li | Zendy

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Ultrasonic flaw sizing - An overview

Author(s) -

Lester W. Schmerr,

Brady J. Engle,

Alexander Sedov,

Xiongbing Li

Publication year - 2013

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.177

H-Index - 75

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.4789261

Subject(s) - sizing , ultrasonic sensor , computer science , phased array , engineering , acoustics , telecommunications , physics , art , antenna (radio) , visual arts

The time-of-flight diffraction (TOFD) technique is one of the most common sizing methods in practical use by industry today. This method was developed over 40 years ago and is based on the technology and state of knowledge present at that time. A combination of phased arrays and equivalent flaw sizing methods are proposed as the foundation for a new generation of sizing methods that go beyond TOFD sizing.

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