Open AccessHigh resolution X-ray micro-CT of ultra-thin wall space components
Author(s) -
Don J. Roth,
Richard W. Rauser,
Randy Bowman,
Peter J. Bonacuse,
Richard E. Martin,
Ivan E. Locci,
Maurice J. Kelley
Publication year - 2013
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4789101
Subject(s) - vendor , characterization (materials science) , software , computer science , calibration , process (computing) , development (topology) , sample (material) , spacecraft , systems engineering , aerospace engineering , materials science , engineering , physics , nanotechnology , operating system , mathematical analysis , mathematics , marketing , quantum mechanics , business , thermodynamics
A high resolution micro-CT system has been assembled and is being used to provide optimal characterization for ultra-thin wall space components. The Glenn Research Center NDE Sciences Team, using this CT system, has assumed the role of inspection vendor for the Advanced Stirling Convertor (ASC) project at NASA. This article will discuss many aspects of the development of the CT scanning for this type of component, including CT system overview; inspection requirements; process development, software utilized and developed to visualize, process, and analyze results; calibration sample development; results on actual samples; correlation with optical/SEM characterization; CT modeling; and development of automatic flaw recognition software.
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