Open AccessUltrafast optical technique for measuring the electrical dependence of the elasticity of piezoelectric thin film: Demonstration on AlN
Author(s) -
A. Devos,
P. Emery,
Emmanuel Defaÿ,
Nizar Ben Hassine,
G. Parat
Publication year - 2013
Publication title -
review of scientific instruments
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.605
H-Index - 165
eISSN - 1089-7623
pISSN - 0034-6748
DOI - 10.1063/1.4788936
Subject(s) - materials science , piezoelectricity , thin film , ultrashort pulse , elasticity (physics) , nitride , piezoelectric coefficient , optoelectronics , stiffness , electrode , voltage , layer (electronics) , optics , acoustics , composite material , nanotechnology , laser , electrical engineering , physics , engineering , quantum mechanics
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