Single-order operation of lamellar multilayer gratings in the soft x-ray spectral range
Author(s) -
R. van der Meer,
I. V. Kozhevnikov,
B. Krishnan,
Jurriaan Huskens,
P.E. Hegeman,
C. G. S. Brons,
B. Vratzov,
Hubertus M.J. Bastiaens,
Klaus J. Boller,
F. Bijkerk
Publication year - 2013
Publication title -
aip advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.421
H-Index - 58
ISSN - 2158-3226
DOI - 10.1063/1.4774297
Subject(s) - lamellar structure , optics , materials science , sideband , soft x rays , spectral resolution , range (aeronautics) , resolution (logic) , free spectral range , spectral line , optoelectronics , physics , wavelength , laser , quantum mechanics , astronomy , artificial intelligence , microwave , computer science , composite material
We demonstrate single-order operation of Lamellar Multilayer Gratings in the soft x-ray spectral range. The spectral resolution was found to be 3.8 times higher than from an unpatterned multilayer mirror, while there were no significant spectral sideband structures adjacent to the main Bragg peak. The measured spectral bandwidths and peak reflectivities were in good agreement with our theoretical calculations
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