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The c-axis thermal conductivity of graphite film of nanometer thickness measured by time resolved X-ray diffraction
Author(s) -
Maher Harb,
Clemens von Korff Schmising,
H. Enquist,
A. Jurgilaitis,
Ivan Maximov,
Petr Shvets,
A. N. Obraztsov,
Dmitry Khakhulin,
Michaël Wulff,
Jörgen Larsson
Publication year - 2012
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4769214
Subject(s) - thermal conductivity , materials science , chemical vapor deposition , graphite , thermal diffusivity , diffraction , graphene , thermal conductivity measurement , conductivity , nanometre , thin film , analytical chemistry (journal) , optics , composite material , nanotechnology , chemistry , thermodynamics , physics , chromatography

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