Open AccessCharacterization of the state of a droplet on a micro-textured silicon wafer using ultrasound
Author(s) -
Nadine Saad,
Renaud Dufour,
Pierre Campistron,
Georges Nassar,
Julien Carlier,
Maxime Harnois,
B. Merheb,
Rabah Boukherroub,
Vincent Senez,
Jamin Gao,
V. Thomy,
M. Ajaka,
Bertrand gaillard
Publication year - 2012
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4767223
Subject(s) - wafer , wetting , materials science , silicon , characterization (materials science) , reflection (computer programming) , work (physics) , surface acoustic wave , optics , optoelectronics , composite material , nanotechnology , thermodynamics , physics , computer science , programming language
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