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The thickness and stretch dependence of the electrical breakdown strength of an acrylic dielectric elastomer
Author(s) -
Jiangshui Huang,
Samuel Shian,
Roger M. Diebold,
Zhigang Suo,
David R. Clarke
Publication year - 2012
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.4754549
Subject(s) - elastomer , materials science , composite material , dielectric , electrical breakdown , dielectric elastomers , dielectric strength , electric field , electrode , optoelectronics , chemistry , physics , quantum mechanics
(Article begins on next page) The Harvard community has made this article openly available. Please share how this access benefits you. Your story matters. Citation Huang, Jiangshui, Samuel Shian, Roger M. Diebold, ZhigangSuo, and David R. Clarke. 2012. The thickness and stretch dependence of the electrical breakdown strength of an acrylic dielectric elastomer. Applied Physics Letters 101:122905. Published Version doi:10.1063/1.475454

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