Open AccessExperience from reliability field trails
Author(s) -
M. K. Spencer,
Andrew Kearney,
John K Bowman
Publication year - 2012
Publication title -
aip conference proceedings
Language(s) - Uncategorized
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4753884
Subject(s) - reliability (semiconductor) , field (mathematics) , reliability engineering , field trial , population , computer science , term (time) , engineering , mathematics , medicine , agronomy , power (physics) , physics , environmental health , quantum mechanics , pure mathematics , biology
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