Accessing intermediate ferroelectric switching regimes with time-resolved transmission electron microscopy
Author(s) -
Christopher Winkler,
Michael L. Jablonski,
Anoop R. Damodaran,
K. Jambunathan,
Lane W. Martin,
Mitra L. Taheri
Publication year - 2012
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4746082
Subject(s) - ferroelectricity , materials science , nucleation , multiferroics , piezoresponse force microscopy , transmission electron microscopy , electric field , biasing , spintronics , optoelectronics , coalescence (physics) , scanning transmission electron microscopy , nanotechnology , condensed matter physics , dielectric , ferromagnetism , physics , voltage , quantum mechanics , astrobiology , thermodynamics
BiFeO3 (BFO) is one of the most widely studied magneto-electric multiferroics. The magneto-electric coupling in BiFeO3, which allows for the control of the ferroelectric and magnetic domain structures via applied electric fields, can be used to incorporate BiFeO3 into novel spintronics devices and sensors. Before BiFeO3 can be integrated into such devices, however, a better understanding of the dynamics of ferroelectric switching, particularly in the vicinity of extended defects, is needed. We use in situ transmission electron microscopy (TEM) to investigate the response of ferroelectric domains within BiFeO3 thin films to applied electric fields at high temporal and spatial resolution. This technique is well suited to imaging the observed intermediate ferroelectric switching regimes, which occur on a time- and length-scale that are too fine to study via conventional scanning-probe techniques. Additionally, the spatial resolution of transmission electron microscopy allows for the direct study of the dynam...
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