Open AccessTop electrode size effect on hysteresis loops in piezoresponse force microscopy of Pb(Zr,Ti)O3-film on silicon structures
Author(s) -
S. L. Bravina,
Nicholas V. Morozovsky,
Eugene A. Eliseev,
An. Morozovska,
J. Costecalde,
Caroline Soyer,
Denis Rémiens,
D. Deresmes
Publication year - 2012
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4746028
Subject(s) - materials science , piezoresponse force microscopy , ferroelectricity , electrode , condensed matter physics , dielectric , hysteresis , sputter deposition , silicon , permittivity , coercivity , thin film , composite material , sputtering , nanotechnology , optoelectronics , chemistry , physics
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