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Cavity mode gain alignment in GaAsSb-based near-infrared vertical cavity lasers studied by spectroscopy and device measurements
Author(s) -
G. Blume,
K. Hild,
Igor P. Marko,
T. J. C. Hosea,
Shui-Qing Yu,
S. A. Chaparro,
N. Samal,
S. R. Johnson,
Y.-H. Zhang,
Stephen J. Sweeney
Publication year - 2012
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.4744985
Subject(s) - vertical cavity surface emitting laser , materials science , optoelectronics , laser , lasing threshold , electroluminescence , wafer , optics , quantum well , wavelength , physics , layer (electronics) , composite material

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