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A systematic error in X-ray grating interferometry due to asymmetric scattering distributions
Author(s) -
Peter Modregger,
B Pinzer,
Marco Stampai
Publication year - 2012
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.4742306
Subject(s) - interferometry , grating , scattering , optics , systematic error , physics , phase (matter) , signal (programming language) , sensitivity (control systems) , astronomical interferometer , contrast (vision) , process (computing) , computer science , mathematics , electronic engineering , quantum mechanics , statistics , engineering , programming language , operating system

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