z-logo
open-access-imgOpen Access
Disorder-free sputtering method on graphene
Author(s) -
Xue Peng Qiu,
Young Jun Shin,
Jing Niu,
Kulothungasagaran Narayanapillai,
K. Gopinadhan,
Caiyu Qiu,
Ting Yu,
Hyunsoo Yang
Publication year - 2012
Publication title -
aip advances
Language(s) - English
Resource type - Journals
ISSN - 2158-3226
DOI - 10.1063/1.4739783
Subject(s) - graphene , sputtering , materials science , indium tin oxide , substrate (aquarium) , optoelectronics , oxide , sputter deposition , spintronics , nanotechnology , deposition (geology) , thin film , metallurgy , ferromagnetism , condensed matter physics , paleontology , sediment , biology , oceanography , physics , geology
Deposition of various materials onto graphene without causing any disorder is highly desirable for graphene applications. Especially, sputtering is a versatile technique to deposit various metals and insulators for spintronics, and indium tin oxide to make transparent devices. However, the sputtering process causes damage to graphene because of high energy sputtered atoms. By flipping the substrate and using a high Ar pressure, we demonstrate that the level of damage to graphene can be reduced or eliminated in dc, rf, and reactive sputtering processes

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom