Dielectronic recombination measurements of highly-charged heliumlike and neonlike ions using an electron beam ion trap
Author(s) -
M. B. Schneider,
David A. Knapp,
P. Beiersdörfer,
Mau H. Chen,
J. H. Scofield,
C. L. Bennett,
D. R. DeWitt,
J. R. Henderson,
Patricia Lee,
Morton A. Levine,
R. E. Marrs,
Dieter Schneider
Publication year - 1992
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.42473
Subject(s) - electron beam ion trap , atomic physics , ion , ionization , ion trap , physics , electron , cathode ray , nuclear physics , quantum mechanics
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