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Grain-size effect on pressure-induced semiconductor-to-metal transition in ZnS
Author(s) -
Jingyi Jiang,
L. Gerward,
D. J. Frost,
Richard A. Secco,
J. Peyronneau,
J. Staun Olsen
Publication year - 1999
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.371631
Subject(s) - grain size , materials science , semiconductor , transition metal , metal , metallurgy , analytical chemistry (journal) , chemistry , optoelectronics , catalysis , biochemistry , chromatography
The grain-size effect on the semiconductor-to-metal transition in ZnS has been investigated by in situ high-pressure electrical resistance and optical measurements. It is found that the grain-size effect can elevate the transition pressure of ZnS in a larger pressure range. On the basis of the results obtained and results reported in the literature, we demonstrate that the dangers of using the transition pressures of the II–VI compounds as pressure calibrators without a detailed knowledge of their grain-size effects on the transition pressures cannot be overstressed.

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