Electrical characterization of ZnO ceramics by scanning tunneling spectroscopy and beam-induced current in the scanning tunneling microscope | Zendy

C. Dı́az-Guerra | Zendy; J. Piqueras | Zendy

Open Access

Electrical characterization of ZnO ceramics by scanning tunneling spectroscopy and beam-induced current in the scanning tunneling microscope

Author(s) -

C. Dı́az-Guerra,

J. Piqueras

Publication year - 1999

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/1.370982

Subject(s) - scanning tunneling microscope , scanning electron microscope , scanning tunneling spectroscopy , materials science , grain boundary , electron beam induced current , electrochemical scanning tunneling microscope , electron beam induced deposition , spectroscopy , spin polarized scanning tunneling microscopy , characterization (materials science) , microscope , conventional transmission electron microscope , optics , scanning transmission electron microscopy , optoelectronics , nanotechnology , microstructure , physics , metallurgy , quantum mechanics , composite material

A correlative study of the electrically active grain boundary structure of ZnO polycrystals has been carried out using a scanning electron microscope/scanning tunneling microscope (SEM/STM) combined instrument. Current imaging tunneling spectroscopy (CITS) measurements reveal reduced surface band gaps, as compared with grain interiors, at the charged boundaries imaged by SEM-based remote electron beam induced current (REBIC). ZnO grain boundaries were also imaged in the STM-REBIC mode with a resolution of up to 20 nm. The contrast differences observed in the SEM-REBIC and STM-REBIC images are discussed in terms of the different experimental conditions used in both techniques

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