Open AccessPublisher’s Note: “In situ analysis of elemental depth distributions in thin films by combined evaluation of synchrotron x ray fluorescence and diffraction” [J. Appl. Phys. 109, 123515 (2011)]
Author(s) -
Roland Mainz,
R. Klenk
Publication year - 2012
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3703073
Subject(s) - synchrotron , x ray fluorescence , diffraction , in situ , fluorescence , x ray crystallography , thin film , analytical chemistry (journal) , materials science , elemental analysis , chemistry , optics , physics , nanotechnology , inorganic chemistry , organic chemistry , chromatography
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