Thermal boundary resistance at silicon-silica interfaces by molecular dynamics simulations
Author(s) -
E. Lampin,
Quang-Hai Nguyen,
Pierre-Arnaud Francioso,
Fabrizio Cleri
Publication year - 2012
Publication title -
applied physics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.3698325
Subject(s) - interfacial thermal resistance , molecular dynamics , amorphous solid , materials science , silicon , temperature jump , thermal , relaxation (psychology) , crystalline silicon , thermal resistance , chemical physics , heat transfer , amorphous silicon , amorphous silica , heat flux , boundary (topology) , thermodynamics , chemical engineering , crystallography , chemistry , computational chemistry , physics , optoelectronics , mathematics , mathematical analysis , engineering , psychology , social psychology
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