Open AccessPublisher’s Note: “Effect of nickel contamination on high carrier lifetime n-type crystalline silicon” [J. Appl. Phys. 111, 033702 (2012)]
Author(s) -
Yohan Yoon,
Bijaya Paudyal,
Jin-Woo Kim,
YoungWoo Ok,
Prashant K. Kulshreshtha,
Steve Johnston,
G. A. Rozgonyi
Publication year - 2012
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3689822
Subject(s) - silicon , nickel , contamination , materials science , engineering physics , metallurgy , physics , ecology , biology
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