Open AccessAn application of the emissive layer technique to temperature measurement by infrared optical pyrometer
Author(s) -
Camille Chauvin,
Jacques Petit,
F. Sinatti
Publication year - 2012
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3686295
Subject(s) - emissivity , pyrometer , radiance , materials science , layer (electronics) , temperature measurement , infrared , optics , thermal , atmospheric temperature range , optoelectronics , composite material , thermodynamics , physics
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