High-Resolution X-Ray Imaging for Microbiology at the Advanced Photon Source
Author(s) -
Barry Lai,
Kenneth Kemner,
J. Mäser,
Mark Schneegurt,
Zhen Cai,
P. Ilinski,
Charles F. Kulpa,
D. Legnini,
Kenneth H. Nealson,
S. T. Pratt,
W. Rodrigues,
Morris Tischler,
Yun Wu,
D. S. Gemmell,
S. H. Southworth,
R. W. Dunford,
E. P. Kanter,
Linda Young
Publication year - 2000
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3682826
Subject(s) - synchrotron , synchrotron radiation , microelectronics , microscope , microscopy , advanced photon source , nanotechnology , materials science , microanalysis , optics , chemistry , physics , beamline , beam (structure) , organic chemistry
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