Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains | Zendy

Jesse Williams | Zendy; Igor Píš | Zendy; Masaaki Kobata | Zendy; Aimo Winkelmann | Zendy; T. Matsushita | Zendy; Yutaka Adachi | Zendy; Naoki Ohashi | Zendy; Keisuke Kobayashi | Zendy

Open Access

Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains

Author(s) -

Jesse Williams,

Igor Píš,

Masaaki Kobata,

Aimo Winkelmann,

T. Matsushita,

Yutaka Adachi,

Naoki Ohashi,

Keisuke Kobayashi

Publication year - 2012

Publication title -

journal of applied physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.699

H-Index - 319

eISSN - 1089-7550

pISSN - 0021-8979

DOI - 10.1063/1.3682088

Subject(s) - crystallite , polarity (international relations) , diffraction , photoelectric effect , zinc , materials science , crystallography , oxide , x ray photoelectron spectroscopy , single crystal , chemistry , molecular physics , optics , physics , optoelectronics , nuclear magnetic resonance , biochemistry , metallurgy , cell

X ray photoelectron diffraction (XPD) patterns of polar zinc oxide (ZnO) surfaces were investigated experimentally using hard x rays and monochromatized Cr Kα radiation and theoretically using a cluster model approach and a dynamical Bloch wave approach. We focused on photoelectrons emitted from the Zn 2p3/2 and O 1s orbitals in the analysis. The obtained XPD patterns for the (0001) and (0001¯) surfaces of a ZnO single crystal were distinct for a given emitter and polarity. Polarity determination of c-axis-textured polycrystalline ZnO thin films was also achieved with the concept of XPD, even though the in-plane orientation of the columnar ZnO grains was random.

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