z-logo
open-access-imgOpen Access
Polarization switching at the nanoscale in ferroelectric copolymer thin films
Author(s) -
R. V. Gaynutdinov,
S. V. Mitko,
S. G. Yudin,
V. M. Fridkin,
Stephen Ducharme
Publication year - 2011
Publication title -
applied physics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.182
H-Index - 442
eISSN - 1077-3118
pISSN - 0003-6951
DOI - 10.1063/1.3646906
Subject(s) - materials science , ferroelectricity , nucleation , polarization (electrochemistry) , thin film , nanoscopic scale , kinetics , copolymer , coercivity , switching time , condensed matter physics , optoelectronics , nanotechnology , composite material , polymer , dielectric , thermodynamics , chemistry , physics , quantum mechanics
The polarization switching kinetics were measured at the nanoscale in continuous thin films of a ferroelectric copolymer of vinylidene fluoride and trifluoroethylene. The dependence of the switching rate on voltage for a 54-nm thick film exhibits extrinsic nucleation and domain-growth type kinetics with no true threshold coercive field, and is qualitatively different from the behavior of an 18-nm thick film, which exhibits intrinsic switching kinetics, and a true threshold field. The results are consistent with studies of thin film capacitors of much larger area and with a recent refinement of the theory of the critical size for intrinsic switching.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom