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Reduced auger recombination in mid-infrared semiconductor lasers
Author(s) -
Robert Bedford,
Gregory Triplett,
D. H. Tomich,
S. W. Koch,
Jerome V. Moloney,
J. Hader
Publication year - 2011
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.3646552
Subject(s) - auger , auger effect , laser , semiconductor laser theory , optoelectronics , semiconductor , quantum well , materials science , carrier lifetime , atomic physics , infrared , reduction (mathematics) , optics , physics , silicon , geometry , mathematics
A quantum-design approach to reduce the Auger losses in λ = 2 μm InGaSb type-I quantum well edge-emitting lasers is reported. Experimentally realized structures show a ∼3 × reduction in the threshold, which results in 4.6 × lower Auger current loss at room temperature. This is equivalent to a carrier lifetime improvement of 5.7 × and represents about a 19-fold reduction in the equivalent “Auger coefficient.”

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