Sintered alumina with low dielectric loss
Author(s) -
Neil McN. Alford,
S.J. Penn
Publication year - 1996
Publication title -
journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.699
H-Index - 319
eISSN - 1089-7550
pISSN - 0021-8979
DOI - 10.1063/1.363584
Subject(s) - materials science , dielectric loss , aluminium , dielectric , microstructure , sapphire , aluminium oxide , sintering , crystallite , impurity , ceramic , oxide , doping , composite material , microwave , aluminium oxides , titanium , metallurgy , mineralogy , optics , optoelectronics , chemistry , laser , biochemistry , physics , organic chemistry , quantum mechanics , catalysis
Low dielectric loss materials are required for applications in radio‐frequency and microwave communications. Aluminium is the second most abundant element in the Earth’s crust and aluminium oxide (alumina) is one of the commonest ceramics. Single crystals of aluminium oxide, i.e., sapphire, possess one of the lowest dielectric losses of any material. Polycrystalline alumina has a higher loss due to extrinsic factors. The dielectric loss of sintered alumina is studied in an attempt to determine the causes of extrinsic loss. Impurities are shown to play an important role, but the microstructure also is a key factor. High‐purity aluminas, sintered to near theoretical density, are found to display very low loss, tan δ=2.7×10−5 at 10 GHz. Doping alumina with titanium dioxide was found to reduce the tan δ=2×10−5.
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