Imaging trapped ions with an integrated microfabricated optic | Zendy

Erik W. Streed | Zendy; B. G. Norton | Zendy; T. J. Weinhold | Zendy; D. Kielpinski | Zendy; Timothy C. Ralph | Zendy; Ping Koy Lam | Zendy

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Imaging trapped ions with an integrated microfabricated optic

Author(s) -

Erik W. Streed,

B. G. Norton,

T. J. Weinhold,

D. Kielpinski,

Timothy C. Ralph,

Ping Koy Lam

Publication year - 2011

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.177

H-Index - 75

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.3630177

Subject(s) - ion , fresnel lens , optics , lens (geology) , quantum efficiency , materials science , saturation (graph theory) , focus (optics) , optoelectronics , physics , mathematics , combinatorics , quantum mechanics

We have integrated a microfabricated phase Fresnel lens (PFL) with an ion trap and used it to image a 174Yb+ ion. The observed collection efficiency was 4.1± 1.3%, in agreement with a predicted performance of 4.6% based on optical characterization and suitable for use in quantum computing. A maximum signal to background scatter noise of 23±4 was measured near saturation intensity (s = 0.7). The depth of focus was 11 μm and the field of view in excess of 100 μm across.

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