Accurate Resolution Measurement for X‐Ray Micro‐CT Systems
Author(s) -
Kriti Sen Sharma,
Srivatsan Seshadri,
Michael Feser,
G. Wang
Publication year - 2011
Publication title -
aip conference proceedings
Language(s) - Uncategorized
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3625373
Subject(s) - optical transfer function , image resolution , resolution (logic) , point spread function , scanner , projection (relational algebra) , computer science , ground truth , computer vision , artificial intelligence , optics , point (geometry) , physics , mathematics , algorithm , geometry
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