Optimizing the Illumination in a Hard X-ray Microscope with Integrated Talbot Interferometer | Zendy

Kentaro Uesugi | Zendy; Akihisa Takeuchi | Zendy; Masato Hoshino | Zendy; Yoshio Suzuki | Zendy; Ian McNulty | Zendy; Catherine Eyberger | Zendy; Barry Lai | Zendy

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Optimizing the Illumination in a Hard X-ray Microscope with Integrated Talbot Interferometer

Author(s) -

Kentaro Uesugi,

Akihisa Takeuchi,

Masato Hoshino,

Yoshio Suzuki,

Ian McNulty,

Catherine Eyberger,

Barry Lai

Publication year - 2011

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.3625366

Subject(s) - optics , interferometry , talbot effect , zone plate , condenser (optics) , microscope , grating , image resolution , phase (matter) , phase contrast imaging , fresnel zone , fresnel diffraction , interference microscopy , interference (communication) , resolution (logic) , tomography , spatial frequency , diffraction grating , physics , phase contrast microscopy , diffraction , computer science , light source , quantum mechanics , artificial intelligence , computer network , channel (broadcasting)

A high spatial resolution x‐ray phase imaging system was developed at BL47XU in SPring‐8, which uses a full‐field x‐ray microscope with a Fresnel zone plate (FZP) as an objective and a condenser zone plate (CZP) for pseudo‐Kohler illumination. For quantitative phase contrast imaging, a grating interferometer (Talbot type interferometer) was developed. The combination of these optics is suitable for phase contrast imaging with high spatial resolution. The optimal conditions for phase tomography were found.

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