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Bragg Coherent Diffraction Imaging of Epitaxial Nanostructures Using Focused Hard X‐ray Ptychography
Author(s) -
S. O. Hruszkewycz,
Martin V. Holt,
Danielle L. Proffit,
Matthew J. Highland,
Alexandra JoshiImre,
J. Maser,
J. A. Eastman,
Gongxun Bai,
P. H. Fuoss
Publication year - 2011
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3625347
Subject(s) - ptychography , optics , coherent diffraction imaging , diffraction , bragg's law , materials science , bragg peak , resolution (logic) , x ray crystallography , nanostructure , x ray , phase (matter) , phase retrieval , physics , nanotechnology , computer science , beam (structure) , fourier transform , quantum mechanics , artificial intelligence

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