Open AccessDevelopment of X-ray Microscopy at IPOE
Author(s) -
Jiwei Zhu,
Baozhong Mu,
Qin Gan Huang,
C. Huang,
Shengzhen Yi,
Z. Zhang,
Fei Wang,
Zhiyu Wang,
L. Chen,
Ian McNulty,
Catherine Eyberger,
Barry Lai
Publication year - 2011
Publication title -
aip conference proceedings
Language(s) - English
Resource type - Conference proceedings
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3625340
Subject(s) - materials science , polishing , optics , synchrotron radiation , x ray optics , optical microscope , microscope , synchrotron , diffraction , planar , coating , microscopy , x ray , zone plate , layer (electronics) , surface finish , surface roughness , nanometre , scanning electron microscope , composite material , physics , computer graphics (images) , computer science
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