Open AccessZone-Doubled Fresnel Zone Plates for Scanning Transmission X-ray Microscopy
Author(s) -
Joan VilaComamala,
Sergey Gorelick,
Elina Färm,
Cameron M. Kewish,
Ana Díaz,
Vitaliy A. Guzenko,
R. Barrett,
Jörg Raabe,
Andreas Menzel,
Oliver Bunk,
Mikko Ritala,
C. David,
Ian McNulty,
Catherine Eyberger,
Barry Lai
Publication year - 2011
Publication title -
aip conference proceedings
Language(s) - Uncategorized
Resource type - Conference proceedings
SCImago Journal Rank - 0.177
H-Index - 75
eISSN - 1551-7616
pISSN - 0094-243X
DOI - 10.1063/1.3625337
Subject(s) - zone plate , optics , fresnel zone , materials science , transmission electron microscopy , lithography , fresnel diffraction , electron beam lithography , scanning electron microscope , microscopy , diffraction , layer (electronics) , physics , resist , nanotechnology
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