The Soft X-ray Spectromicroscopy Beamline at SSRF | Zendy

Zhenyu Guo | Zendy; Renzhong Tai | Zendy; Y. Wand | Zendy; Ruoxue Yan | Zendy; M. Chen | Zendy; Yang Wu | Zendy; J. Chen | Zendy; Song Xue | Zendy; Hong Jie Xu | Zendy; Ian McNulty | Zendy; Catherine Eyberger | Zendy; Barry Lai | Zendy

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The Soft X-ray Spectromicroscopy Beamline at SSRF

Author(s) -

Zhenyu Guo,

Renzhong Tai,

Y. Wand,

Ruoxue Yan,

M. Chen,

Yang Wu,

J. Chen,

Song Xue,

Hong Jie Xu,

Ian McNulty,

Catherine Eyberger,

Barry Lai

Publication year - 2011

Publication title -

aip conference proceedings

Language(s) - English

Resource type - Conference proceedings

SCImago Journal Rank - 0.177

H-Index - 75

eISSN - 1551-7616

pISSN - 0094-243X

DOI - 10.1063/1.3625330

Subject(s) - beamline , image resolution , computer science , optics , remote sensing , physics , geology , beam (structure)

Commissioning of the soft x-ray spectromicroscopy beanmline at SSRF was formally started on Dec 26, 2008. Beamline performance has reached or surpassed the designing goals according to the measurements by domestic experts, especially for its high energy resolution and high spatial resolution. Since its first operation by users on May 6, 2009, tens of experiments have been conducted, and some preliminary exciting results have been acquired. © 2011 American Institute of Physics.

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